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    ME2500 Design for Testability (ME2500)

    ME2500 Design for Testability

    Solution Overview

    The ME2500 serves as a ready-to-teach package in test engineering and design for testability (DfT). This is a lecturer-resource consisting of teaching-slides for one full-semester course.


    Learning Outcomes

    Upon completion of this course, students would be able to:

    Understand basics of test engineering and design for testability

    • Analyse and apply DfT structures for delay testing
    • Evaluate IDDQ Test for deep sub-micron technologies
    • Evaluate and apply scan design for functional and delay testing
    • Understand various standards for embedded core-test
    • Understand and apply Built-in Self Test (BIST)

    Benefits of the ME2500 courseware:

    • Content created by Prof. Andrew Richardson (Lancaster University) a Design for Test expert who has years of teaching and research experience in this field
    • Slides are depicted with footnotes and clear illustrations of diagrams for ease of understanding
    • The slides are editable in Microsoft PowerPoint for ease of customization
    • Recommendations for reference materials for further study at the end of each chapter

    Sample Teaching Slides  Download Data Sheet


    ME2500-100 Design for Testability - Teaching SlidesN/A RFQ

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